W. Claeys

Jorez S, Dilhaire S, Lopez P, et al. Strain imaging in thermoelectric components by laser probe shearography. In: Proceedings International Conference On Thermoelectrics,. Beijing China: IEEE Catalog number 01TH8589; 2001:503-506. Jorez-ICT-2001.pdf.

Jorez S, Dilhaire S, Lopez LP, et al. Strain imaging in thermoelectric devices by laser probe shearography. Proceedings ICT2001. 20 International Conference on Thermoelectrics. 2001:503-6.

Patino-Lopez LD, Dilhaire S, Grauby S, et al. Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement. Proceedings ICT2001. 20 International Conference on Thermoelectrics. 2001:499-502.

Pati\~no_Lopez LD, Dilhaire S, Grauby S, et al. Study of the thermal behaviour of PN thermoelectric couples by Laser Probe Interferometric Measurement. In: Proceedings International Conference On Thermoelectrics,. Beijing, China: IEEE Catalog number 01TH8589; 2001:499-502. doi:Proceedings International conference on Thermoelectrics,