<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Jorez, S.</style></author><author><style face="normal" font="default" size="100%">Dilhaire, S.</style></author><author><style face="normal" font="default" size="100%">L. Patino Lopez</style></author><author><style face="normal" font="default" size="100%">Grauby, S.</style></author><author><style face="normal" font="default" size="100%">Claeys, W.</style></author><author><style face="normal" font="default" size="100%">K-I. Uemura</style></author><author><style face="normal" font="default" size="100%">Stockholm, J. G.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Strain imaging in thermoelectric components by laser probe shearography</style></title><secondary-title><style face="normal" font="default" size="100%">Proceedings International conference on Thermoelectrics</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2001</style></year><pub-dates><date><style  face="normal" font="default" size="100%">8-10 June 2001</style></date></pub-dates></dates><urls><related-urls><url><style face="normal" font="default" size="100%">http://www.marvelte.com/system/files/Jorez-ICT-2001.pdf</style></url></related-urls></urls><publisher><style face="normal" font="default" size="100%">IEEE Catalog number 01TH8589,</style></publisher><pub-location><style face="normal" font="default" size="100%">Beijing China</style></pub-location><pages><style face="normal" font="default" size="100%">503-506</style></pages><isbn><style face="normal" font="default" size="100%">1094-2734</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>