<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Jorez, S.</style></author><author><style face="normal" font="default" size="100%">Dilhaire, S.</style></author><author><style face="normal" font="default" size="100%">L. Patino Lopez</style></author><author><style face="normal" font="default" size="100%">Grauby, S.</style></author><author><style face="normal" font="default" size="100%">Claeys, W.</style></author><author><style face="normal" font="default" size="100%">K-I. Uemura</style></author><author><style face="normal" font="default" size="100%">Stockholm, J. G.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Strain imaging in thermoelectric components by laser probe shearography</style></title><secondary-title><style face="normal" font="default" size="100%">Proceedings International conference on Thermoelectrics</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2001</style></year><pub-dates><date><style  face="normal" font="default" size="100%">8-10 June 2001</style></date></pub-dates></dates><urls><related-urls><url><style face="normal" font="default" size="100%">http://www.marvelte.com/system/files/Jorez-ICT-2001.pdf</style></url></related-urls></urls><publisher><style face="normal" font="default" size="100%">IEEE Catalog number 01TH8589,</style></publisher><pub-location><style face="normal" font="default" size="100%">Beijing China</style></pub-location><pages><style face="normal" font="default" size="100%">503-506</style></pages><isbn><style face="normal" font="default" size="100%">1094-2734</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language></record><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>47</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">L. D. Patiño_Lopez</style></author><author><style face="normal" font="default" size="100%">Dilhaire, S.</style></author><author><style face="normal" font="default" size="100%">Grauby, S.</style></author><author><style face="normal" font="default" size="100%">Jorez, S.</style></author><author><style face="normal" font="default" size="100%">Claeys, W.</style></author><author><style face="normal" font="default" size="100%">K-I. Uemura</style></author><author><style face="normal" font="default" size="100%">John G. Stockholm</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Study of the thermal behaviour of PN thermoelectric couples by Laser Probe Interferometric Measurement</style></title><secondary-title><style face="normal" font="default" size="100%">Proceedings International conference on Thermoelectrics</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2001</style></year><pub-dates><date><style  face="normal" font="default" size="100%">8-10 June 2001</style></date></pub-dates></dates><urls><related-urls><url><style face="normal" font="default" size="100%">http://www.marvelte.com/system/files/Lopez-ICT-2001.pdf</style></url></related-urls></urls><publisher><style face="normal" font="default" size="100%">IEEE Catalog number 01TH8589</style></publisher><pub-location><style face="normal" font="default" size="100%">Beijing, China</style></pub-location><pages><style face="normal" font="default" size="100%">499-502</style></pages><isbn><style face="normal" font="default" size="100%">1094-2734</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language></record><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>10</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Jorez, S.</style></author><author><style face="normal" font="default" size="100%">Dilhaire, S.</style></author><author><style face="normal" font="default" size="100%">Lopez, L. P.</style></author><author><style face="normal" font="default" size="100%">Granby, S.</style></author><author><style face="normal" font="default" size="100%">Claeys, W.</style></author><author><style face="normal" font="default" size="100%">Uemura, K.</style></author><author><style face="normal" font="default" size="100%">Stockholm, J. G.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Strain imaging in thermoelectric devices by laser probe shearography</style></title><secondary-title><style face="normal" font="default" size="100%">Proceedings ICT2001. 20 International Conference on Thermoelectrics</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">displacement measurement</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2001</style></year></dates><publisher><style face="normal" font="default" size="100%">IEEE</style></publisher><pub-location><style face="normal" font="default" size="100%">Piscataway, NJ, USA</style></pub-location><pages><style face="normal" font="default" size="100%">503-6</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">We have developed an original optical set-up and method for the measurement of strain in electronic components. We have applied it for the study of thermoelectric devices. The method is based on speckle interferometry imaging called shearography. Two images of a same object lighted by coherent laser light are recorded upon a CCD camera through an appropriate optical system. The two images are slightly shifted one with respect to the other. This allows determining the gradient of normal surface displacement in the direction of the shift. Information taken in this manner in several directions allows to derive a map of a parameter related to the surface displacement gradients that we call &quot;fragility factor&quot; </style></abstract><accession-num><style face="normal" font="default" size="100%">7246619</style></accession-num></record><record><source-app name="Biblio" version="6.x">Drupal-Biblio</source-app><ref-type>10</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Patino-Lopez, L. D.</style></author><author><style face="normal" font="default" size="100%">Dilhaire, S.</style></author><author><style face="normal" font="default" size="100%">Grauby, S.</style></author><author><style face="normal" font="default" size="100%">Jorez, S.</style></author><author><style face="normal" font="default" size="100%">Claeys, W.</style></author><author><style face="normal" font="default" size="100%">Uemura, K.</style></author><author><style face="normal" font="default" size="100%">Stockholm, J. G.</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Study of the thermal behaviour of PN thermoelectric couples by laser probe interferometric measurement</style></title><secondary-title><style face="normal" font="default" size="100%">Proceedings ICT2001. 20 International Conference on Thermoelectrics</style></secondary-title></titles><keywords><keyword><style  face="normal" font="default" size="100%">light interferometry</style></keyword></keywords><dates><year><style  face="normal" font="default" size="100%">2001</style></year></dates><publisher><style face="normal" font="default" size="100%">IEEE</style></publisher><pub-location><style face="normal" font="default" size="100%">Piscataway, NJ, USA</style></pub-location><pages><style face="normal" font="default" size="100%">499-502</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">The purpose of the present paper is to provide experimental data related to the temperature distribution within thermoelectric devices (TE). Moreover our aim is to get this knowledge for a dynamic temperature response of the device. We propose a non-contact optical measuring method, based upon very high-resolution interferometry, to map temperature effects upon the surface of running thermoelectric devices. The Peltier sources within the device generate thermal waves associated to heat transport. These waves interfere when AC current is driven through the device. The interferences are clearly observed in our measurements, showing how heat flows from different sources and merge. The measuring method can be used to check material properties which in turns allows to optimize contact design </style></abstract><accession-num><style face="normal" font="default" size="100%">7246618</style></accession-num></record></records></xml>